A data set from Oehlert (2000) \emph{A First Course in Design and
Analysis of Experiments}, New York: W. H. Freeman.

Data originally from Taam, W. and M.~Hamada (1993). ``Detecting spatial
effects from factorial experiments: An application from integrated-circuit
manufacturing.'' {\em Technometrics\/}~{\em 35}, 149--160.

These data give the locations of good (1) and bad (0) ICs on a silicon wafer.
Columns are x dimension, y dimension, and good/bad.