Dataset: semicon_qual.dat

Source: C.R. Jensen (2002). "Variance Component Calculations: Common
Methods and Misapplications in the Semiconductor Industry," Quality
Engineering, Vol. 14, #4, pp. 647-657.

Description: Measurements made on 2 silicon wafers, selected from each
of 20 lots, with 9 measurements made per wafer. Variable name was not
given for proprietary reasons.

Variables/Columns
Lot Number    7-8
Wafer (w/in lot) number   16
wafer (across lot) number   23-24
replicate number     32
Measurement      34-40